"Assessment of True Worst Case Circuit Performance Under Interconnect ..."

Emrah Acar et al. (2001)

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DOI: 10.1109/ISQED.2001.915267

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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  - https://dblp.org/rec/conf/isqed/AcarPNL01
Emrah Acar, Lawrence T. Pileggi, Sani R. Nassif, Ying Liu:
Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations. ISQED 2001: 431-436

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