"Zatel: Sample Complexity-Aware Scale-Model Simulation for Ray Tracing."

Davit Grigoryan, Yuan-Hsi Chou, Tor M. Aamodt (2024)

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DOI: 10.1109/ISPASS61541.2024.00024

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Davit Grigoryan, Yuan-Hsi Chou, Tor M. Aamodt:
Zatel: Sample Complexity-Aware Scale-Model Simulation for Ray Tracing. ISPASS 2024: 156-166

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