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"Towards Generalizable Forgery Detection Model via Alignment and Fine-tuning."
Xuekang Peng, Yisheng Li, Zhichao Lian (2024)
- Xuekang Peng, Yisheng Li, Zhichao Lian:
Towards Generalizable Forgery Detection Model via Alignment and Fine-tuning. ISPA 2024: 1623-1628

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