"Analysis of time dependent dielectric breakdown in nanoscale CMOS circuits."

Ho Joon Lee, Kyung Ki Kim (2011)

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DOI: 10.1109/ISOCC.2011.6138626

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ho Joon Lee, Kyung Ki Kim:
Analysis of time dependent dielectric breakdown in nanoscale CMOS circuits. ISOCC 2011: 440-443

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