"Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design."

Minji Lee et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ISOCC50952.2020.9332987

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isocc/LeeCSBKP20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isocc/LeeCSBKP20
Minji Lee, Changseok Choi, Donghyeon Seo, Byeongjun Bang, Yongseok Kang, Woohyun Paik:
Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design. ISOCC 2020: 332-333

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.