"Fault Characterization and Testability Considerations in Multi-Valued ..."

Mostafa I. H. Abd-El-Barr, Maher Al-Sherif, Mohamed Osman (1999)

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DOI: 10.1109/ISMVL.1999.779726

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mostafa I. H. Abd-El-Barr, Maher Al-Sherif, Mohamed Osman:
Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits. ISMVL 1999: 262-267

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