"A YOLO-based Real-time Packaging Defect Detection System."

Thi-Thu-Huyen Vu, Dinh-Lam Pham, Tai-Woo Chang (2023)

Details and statistics

DOI: 10.1016/J.PROCS.2022.12.285

access: open

type: Conference or Workshop Paper

metadata version: 2024-06-08