"Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level ..."

Bon Woong Ku et al. (2016)

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DOI: 10.1145/2934583.2934622

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Bon Woong Ku, Peter Debacker, Dragomir Milojevic, Praveen Raghavan, Diederik Verkest, Aaron Thean, Sung Kyu Lim:
Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs. ISLPED 2016: 76-81

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