"The impact of intra-die device parameter variations on path delays and on ..."

M. Eisele et al. (1996)

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DOI: 10.1109/LPE.1996.547515

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-30

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  - https://dblp.org/rec/conf/islped/EiseleBSM96
M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf:
The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. ISLPED 1996: 237-242

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