"Post-silicon power characterization using thermal infrared emissions."

Ryan Cochran, Abdullah Nazma Nowroz, Sherief Reda (2010)

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DOI: 10.1145/1840845.1840914

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/islped/CochranNR10
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Ryan Cochran, Abdullah Nazma Nowroz, Sherief Reda:
Post-silicon power characterization using thermal infrared emissions. ISLPED 2010: 331-336

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