"Challenges of In-Situ Thermal Characterization of Thin-Film Isolation ..."

Harald Steiner et al. (2018)

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DOI: 10.1109/ISIE.2018.8433750

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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Harald Steiner, Thilo Sauter, Marlies Schlauf, Thomas Schalkhammer, Roman Fuhringer, Dietmar Kieslinger:
Challenges of In-Situ Thermal Characterization of Thin-Film Isolation Layers for Printed Electronics. ISIE 2018: 803-808

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