"ESD protection design for high-speed circuits in nanoscale CMOS process."

Chun-Yu Lin, Rong-Kun Chang (2016)

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DOI: 10.1109/ISICIR.2016.7829726

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-05

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Chun-Yu Lin, Rong-Kun Chang:
ESD protection design for high-speed circuits in nanoscale CMOS process. ISIC 2016: 1-4

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