"Comparing the Fault Detection Effectiveness of N-way and Random Test Suites."

Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu (2004)

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DOI: 10.1109/ISESE.2004.16

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-04

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Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu:
Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. ISESE 2004: 49-59

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