"Elimination of Crucial Faults by a New Selective Testing Method."

Masayuki Hirayama et al. (2002)

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DOI: 10.1109/ISESE.2002.1166937

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, Tohru Kikuno:
Elimination of Crucial Faults by a New Selective Testing Method. ISESE 2002: 183-194

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