"Delay Testable Enhanced Scan Flip-Flop: DFT for High Fault Coverage."

Ashok Kumar Suhag, Vivek Shrivastava (2011)

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DOI: 10.1109/ISED.2011.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-01

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Ashok Kumar Suhag, Vivek Shrivastava:
Delay Testable Enhanced Scan Flip-Flop: DFT for High Fault Coverage. ISED 2011: 129-133

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