"Comparative Study of Test Pattern Generation Systems to Reduce Test ..."

Patare Snehal Dilip, Geethu Remadevi Somanathan, Ramesh Bhakthavatchalu (2019)

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DOI: 10.1109/ISED48680.2019.9096234

access: closed

type: Conference or Workshop Paper

metadata version: 2020-05-27

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Patare Snehal Dilip, Geethu Remadevi Somanathan, Ramesh Bhakthavatchalu:
Comparative Study of Test Pattern Generation Systems to Reduce Test Application Time. ISED 2019: 1-4

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