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"On the Repudiability of Device Identification and Image Integrity ..."
Chang-Tsun Li, Chih-Yuan Chang, Yue Li (2009)
- Chang-Tsun Li, Chih-Yuan Chang, Yue Li:
On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. ISDF 2009: 19-25
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