"Genetic algorithm-based threshold voltage prediction of SOI JLT using ..."

Sandeep Moparthi, Pramod Kumar Tiwari, Gopi Krishna Saramekala (2021)

> Home

Details and statistics

DOI: 10.1109/ISDCS52006.2021.9397911

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isdcs/MoparthiTS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isdcs/MoparthiTS21
Sandeep Moparthi, Pramod Kumar Tiwari, Gopi Krishna Saramekala:
Genetic algorithm-based threshold voltage prediction of SOI JLT using multi-variable nonlinear regression. ISDCS 2021: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.