"Model-based testing of high-resolution ADCs."

Carsten Wegener, Michael Peter Kennedy (2000)

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DOI: 10.1109/ISCAS.2000.857098

access: closed

type: Conference or Workshop Paper

metadata version: 2017-10-22

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Carsten Wegener, Michael Peter Kennedy:
Model-based testing of high-resolution ADCs. ISCAS 2000: 335-338

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