"An efficient BIST method for testing of embedded SRAMs."

Mohammad H. Tehranipour, Zainalabedin Navabi, Seid Mehdi Fakhraie (2001)

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DOI: 10.1109/ISCAS.2001.921988

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Mohammad H. Tehranipour, Zainalabedin Navabi, Seid Mehdi Fakhraie:
An efficient BIST method for testing of embedded SRAMs. ISCAS (5) 2001: 73-76

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