"Investigation of DRAM PUFs reliability under device accelerated aging effects."

Fatemeh Tehranipoor et al. (2017)

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DOI: 10.1109/ISCAS.2017.8050629

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Fatemeh Tehranipoor, Nima Karimian, Wei Yan, John A. Chandy:
Investigation of DRAM PUFs reliability under device accelerated aging effects. ISCAS 2017: 1-4

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