"Novel integration technologies for improving reliability in NAND flash memory."

Hyunyoung Shim et al. (2012)

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DOI: 10.1109/ISCAS.2012.6272054

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Hyunyoung Shim, Myoungkwan Cho, Kunok Ahn, Gihyun Bae, Sungwook Park:
Novel integration technologies for improving reliability in NAND flash memory. ISCAS 2012: 424-427

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