"Statistical modeling of gate-delay variation with consideration of ..."

Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera (2003)

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DOI: 10.1109/ISCAS.2003.1206335

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera:
Statistical modeling of gate-delay variation with consideration of intra-gate variability. ISCAS (5) 2003: 513-516

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