"Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN ..."

Miriam Adlerstein Marwick et al. (2006)

> Home

Details and statistics

DOI: 10.1109/ISCAS.2006.1693650

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iscas/MarwickTPCSA06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iscas/MarwickTPCSA06
Miriam Adlerstein Marwick, Francisco Tejada, Philippe O. Pouliquen, Eugenio Culurciello, Kim Strohbehn, Andreas G. Andreou:
Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN photodiodes. ISCAS 2006

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.