"Impact of temperature fluctuations on circuit characteristics in 180nm and ..."

Ranjith Kumar, Volkan Kursun (2006)

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DOI: 10.1109/ISCAS.2006.1693470

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ranjith Kumar, Volkan Kursun:
Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies. ISCAS 2006

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