"Parallely testable design for detection of neighborhood pattern sensitive ..."

Ju Yeob Kim, Sung Je Hong, Jong Kim (2005)

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DOI: 10.1109/ISCAS.2005.1465970

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ju Yeob Kim, Sung Je Hong, Jong Kim:
Parallely testable design for detection of neighborhood pattern sensitive faults in high density DRAMs. ISCAS (6) 2005: 5854-5857

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