"Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based ..."

Luchang Ding et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ISCAS48785.2022.9937652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iscas/DingCCWZWY22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iscas/DingCCWZWY22
Luchang Ding, Chang Cai, Gengsheng Chen, Zehao Wu, Jing Zhang, Chang Wu, Jun Yu:
Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results. ISCAS 2022: 2281-2285

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.