"Memristive CNN for Wafer defect detection."

Chithra Reghuvaran, A. R. Aswani, Alex Pappachen James (2022)

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DOI: 10.1109/ISCAS48785.2022.9937406

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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Chithra Reghuvaran, A. R. Aswani, Alex Pappachen James:
Memristive CNN for Wafer defect detection. ISCAS 2022: 3284-3288

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