"Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by ..."

Wen-Yi Chen et al. (2009)

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DOI: 10.1109/ISCAS.2009.5117766

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Wen-Yi Chen, Ming-Dou Ker, Yeh-Ning Jou, Yeh-Jen Huang, Geeng-Lih Lin:
Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection. ISCAS 2009: 385-388

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