"An Approach to Detect Negative Bias Temperature Instability (NBTI) in ..."

Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman (2007)

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DOI: 10.1109/ISCAS.2007.378339

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman:
An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. ISCAS 2007: 1257-1260

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