"Accurate On-Chip Linearity Monitoring With Low-Quality Test Signal Generation."

Matthias Wagner et al. (2023)

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DOI: 10.1109/ISCAS46773.2023.10181404

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-31

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Matthias Wagner, Oliver Lang, Simon Dorrer, Esmaeil Kavousi Ghafi, Andreas Schwarz, Mario Huemer:
Accurate On-Chip Linearity Monitoring With Low-Quality Test Signal Generation. ISCAS 2023: 1-5

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