"An experimental study of data retention behavior in modern DRAM devices: ..."

Jamie Liu et al. (2013)

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DOI: 10.1145/2485922.2485928

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jamie Liu, Ben Jaiyen, Yoongu Kim, Chris Wilkerson, Onur Mutlu:
An experimental study of data retention behavior in modern DRAM devices: implications for retention time profiling mechanisms. ISCA 2013: 60-71

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