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"Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines."
Seongmoo Heo et al. (2002)
- Seongmoo Heo, Kenneth C. Barr, Mark Hampton, Krste Asanovic:
Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines. ISCA 2002: 137-147
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