"Investigation of Channel Dimension Dependence of BTI Degradation and ..."

S. Q. Zhang et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117999

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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S. Q. Zhang, Y. S. Sun, D. Gao, H. Jiang, Z. Q. Yu, H. Zheng, J. L. Huang:
Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET. IRPS 2023: 1-4

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