"Surge Energy Robustness of GaN Gate Injection Transistors."

Ruizhe Zhang et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129324

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-06

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Ruizhe Zhang, Joseph P. Kozak, Jingcun Liu, Ming Xiao, Yuhao Zhang:
Surge Energy Robustness of GaN Gate Injection Transistors. IRPS 2020: 1-7

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