"Reliability evaluation of defect accounted time-dependent dielectric ..."

Shinji Yokogawa, Kazuki Tate (2018)

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DOI: 10.1109/IRPS.2018.8353662

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Shinji Yokogawa, Kazuki Tate:
Reliability evaluation of defect accounted time-dependent dielectric breakdown with competing-mixture distribution. IRPS 2018: 2-1

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