"Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced ..."

Chu Yan et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529420

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao:
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. IRPS 2024: 1-6

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