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"Sensitivity to soft errors of NMOS and PMOS transistors evaluated by ..."
Kodai Yamada et al. (2018)
- Kodai Yamada, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi:
Sensitivity to soft errors of NMOS and PMOS transistors evaluated by latches with stacking structures in a 65 nm FDSOI process. IRPS 2018: 3-1
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