"Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node."

Yoni Xiong et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529454

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva:
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. IRPS 2024: 46

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