"Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the ..."

Yoni Xiong et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405128

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung:
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS 2021: 1-5

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