"A common hard-failure mechanism in GaN HEMTs in accelerated switching and ..."

D. Wieland et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117943

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type: Conference or Workshop Paper

metadata version: 2024-10-06

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D. Wieland, S. Ofner, M. Stabentheiner, B. Butej, Christian Koller, J. Sun, Andrea Minetto, K. Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier:
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. IRPS 2023: 1-6

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