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"Utilizing a Thorough Understanding of Critical Aging and Failure ..."

Bonnie E. Weir et al. (2019)

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DOI: 10.1109/IRPS.2019.8720475

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/WeirPMPBBP19
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  - https://dblp.org/rec/conf/irps/WeirPMPBBP19
Bonnie E. Weir, Vani Prasad, Shahriar Moinian, SangJune Park, Joseph Blasko, Jason Brown, Jayanthi Pallinti:
Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits. IRPS 2019: 1-5

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