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"Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade ..."
K. Watanabe et al. (2022)
- K. Watanabe, T. Shimada, K. Hirose, H. Shindo, D. Kobayashi, Takaho Tanigawa, Shoji Ikeda
, Takamitsu Shinada, Hiroki Koike, Tetsuo Endoh, T. Makino, Takeshi Ohshima:
Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. IRPS 2022: 54-1
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