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"BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction ..."
H. W. Wan et al. (2019)
- H. W. Wan, Y. J. Hong, Y. T. Cheng, M. Hong:
BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing. IRPS 2019: 1-4
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