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"A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT."
William Vandendaele et al. (2018)
- William Vandendaele, Xavier Garros, Thomas Lorin, Erwan Morvan, A. Torres, René Escoffier, Marie-Anne Jaud, Marc Plissonnier, Fred Gaillard:
A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT. IRPS 2018: 4
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