"Trap-polarization interaction during low-field trap characterization on ..."

Brecht Truijen et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764603

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Brecht Truijen, Barry J. O'Sullivan, Md. Nurul Alam, Dieter Claes, Mischa Thesberg, Philippe Roussel, Adrian Vaisman Chasin, Geert Van den Bosch, Ben Kaczer, Jan Van Houdt:
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. IRPS 2022: 12-1

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