"Off-state TDDB in FinFET Technology and its Implication for Safe Operating ..."

Maria Toledano-Luque et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405151

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam:
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS 2021: 1-6

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