"Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under ..."

Yasunori Tateno et al. (2018)

> Home

Details and statistics

DOI: 10.1109/IRPS.2018.8353705

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/TatenoKYN18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/TatenoKYN18
Yasunori Tateno, Yasuyo Kurachi, Hiroshi Yamamoto, Takashi Nakabayashi:
Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests. IRPS 2018: 2-1

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.