"Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation ..."

Andrea Natale Tallarico et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129112

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Andrea Natale Tallarico, Susanna Reggiani, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna:
Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. IRPS 2020: 1-5

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