"A novel methodology to evaluate RF reliability for SOI CMOS-based Power ..."

P. Srinivasan et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129588

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min:
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS 2020: 1-4

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